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Using an active probe or FET probe is an effective way to measure high speed signals. Even when using a passive probe, you can effectively reproduce waveforms with less ringing or overshoot by devising different ways to connect to ground. In addition to a variety of passive probes, Yokogawa offers a library of miniature probes, high voltage probes, FET probes, and active probes.
Active Probes:
FET Probes:

For High-Voltage and High-Bandwidth Measurements
Yokogawa's differential probes let you make wide-bandwidth differential measurements. Just connect the output of the prove to the input of the single-ended digital oscilloscope. We provide you a variety of differential probes, which can be utilized for measuring the gate-to-source voltage of a swtiching power supply, read/write signals of a hard disk drive, high-speed logic signals, CAN bus signals, and more.
Differential Probes:

For High Current and Wide Bandwidth Measurements
Yokogawa offers 4 different models of current probes to suit your various current measurement needs. Bandwidths of DC to 2, 10, 50 and 100 MHz are supported, with current measurement ranges of up to 30, 150, or 500A. Measuring current is a simple process of placing the probe clamp directly around the conductor to be measured. The current probes can be powered by the DL's probe power supply terminals. Hence, no external amplifier is required. The probes can be directly connected to the DL series instruments. Current values, in Amperes, can be directly selected via the current probe configuration menu of the DL series instruments, eliminating the usual hastle of voltage / current conversion.
Current Probes:

The DL7400 and DL9700 series let you simultaneously observe multiple signals from analog and logic mixed circuits, in a single instrument. In addition to up to 16 channels of analog inputs, the DL750, DL750P, and SL1400 allow you to observe 16 bit logic signals simultaneously. The following four types of logic probes can be used with these instruments.
Logic Probes: